Magnum, a low-cost performance automated test system, was designed to address the escalating test costs and capacity requirements associated with the flash device market. Compatible with the company’s Maverick line of testers, Magnum brings a new level of integration, performance and cost savings to the problem of volume-production test of price-sensitive consumer-oriented semiconductors.

The Magnum’s product family test systems’ range from 128 pins, up to 7680 pins, and capable of testing a variety of devices, including: NAND, SOC, and logic semiconductors.  With 7,680 pins and 960 sites,  Grande provides IC manufacturers the largest pin count available in the industry today; within a single test head. To accomplish this feat, Nextest integrated what was 12 printed circuit cards worth of electronics onto a single site assembly.  This site assembly combines all the essential elements of a test system, including algorithmic pattern generator, logic sequencer, DUT power supplies, error capture memory, data buffer memory, vector memory, parametric measurement unit, and delivers 128 pins of per-pin resources, including an integrated PC controller, on every assembly. Customers can configure their systems with 4 to 60 site assemblies, and pin-count options ranging from 128 on the Magnum EV, up to 7,680 pins on the Magnum Grande.